contact scanning

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• Scanning voltage microscopy — (SVM) sometimes also called nanopotentiometry is a scientific experimental technique based on atomic force microscopy. A conductive probe, usually only a few nanometers wide at the tip, is placed in full contact with an operational electronic or… …   Wikipedia

• Scanning capacitance microscopy — (SCM) is a variety of scanning probe microscopy in which a narrow probe electrode is held just above the surface of a sample and scanned across the sample. SCM characterizes the surface of the sample using information obtained from the change in… …   Wikipedia

• Scanning probe microscopy — Part of a series of articles on Nanotechnology …   Wikipedia

• Scanning Electron Microscopy — Microscopie électronique à balayage Pour les articles homonymes, voir MEB, SEM et Microscope. Microscope électronique à balayage JEOL JSM 6340F …   Wikipédia en Français

• Near-field scanning optical microscope — Near field scanning optical microscopy (NSOM/SNOM) is a microscopic technique for nanostructure investigation that breaks the far field resolution limit by exploiting the properties of evanescent waves. This is done by placing the detector very… …   Wikipedia

• Coordinate-measuring machine — A coordinate measuring machine (CMM) is a device for measuring the physical geometrical characteristics of an object. This machine may be manually controlled by an operator or it may be computer controlled. Measurements are defined by a probe… …   Wikipedia

• Dimensional metrology — is the science of calibrating and using physical measurement equipment to quantify the physical size of or distance from any given object. Inspection is a critical step in product development and quality control. Dimensional Metrology requires… …   Wikipedia

• Staphylococcus aureus — Scanning electron micrograph of S. aureus, 20,000 times enlargement, false color added Scientific classification Domain: Bacteria …   Wikipedia

• Photoconductive atomic force microscopy — (pc AFM) is a scientific technique.. Multi layer photovoltaic cells have gained popularity since mid 1980s.[1] At the time, research was primarily focused on single layer photovoltaic (PV) devices between two electrodes, in which PV properties… …   Wikipedia

• Atomic force microscope — The atomic force microscope (AFM) or scanning force microscope (SFM) is a very high resolution type of scanning probe microscope, with demonstrated resolution of fractions of a nanometer, more than 1000 times better than the optical diffraction… …   Wikipedia

• 3D scanner — A 3D scanner is a device that analyzes a real world object or environment to collect data on its shape and possibly its appearance (i.e. color). The collected data can then be used to construct digital, three dimensional models useful for a wide… …   Wikipedia